Chen and Jain receive Best Paper Award

Yi Chen and Anil Jain received Best Paper Award for their paper "Dots And Incipients: Extended Features for Partial Fingerprint Matching" at the Biometric Consortium Conference Biometrics Symposium, Baltimore, Maryland, September 11 - 13, 2007. Lockheed Martin sponsored the award.

(Date Posted: 2007-09-19)